Jeffrey M. Voas, Chief Scientist, Reliable Software Technologies, USA
Program Chair
Jeffrey Voas is the Corporate Vice President and Chief Scientist at Reliable Software Technologies. Voas heads the Research Division and is currently the principal investigator on a research initiative for NASA-Ames. He has published over 125 journal and conference papers in the areas of software testability, software reliability, debugging, safety, fault-tolerance, design, and computer security. Voas is widely recognized as a pioneer both in applying practical solutions for measuring software testability and in inventing novel applications for software fault injection methods. Voas's book, Software Assessment: Reliability, Safety, Testability (Wiley 1995), is often used as a text in advanced software engineering courses. Voas and Dr. Gary McGraw recently co-authored Software Fault Injection: Inoculating Programs Against Errors (Wiley 1998). Voas is on the Editorial Board for Software Quality Professional, IT Pro, and IEEE Software.
He is the Executive Secretary of the IEEE Reliability Society for 1998, is a member of the IEEE-USA's Technology Policy Council on R&D Policy, is the Chairman of the Board of Directors for the IEEE's COMPASS Task Force. Voas is an Adjunct Professor of Computer Science at West Virginia University and is on the Board of Trustees of the Center for National Software Studies, a Washington D.C. think tank on national software policy.
E-Mail: jmvoas@rstcorp.com
Program Committee members:
- Ed Allen, Florida Atlantic University, USA
- Hany Ammar, West Virginia University, USA
- Farokh Bastani, UT-Dallas, USA
- Fevzi Belli, Paderborn University, Germany
- Oum-El-Kheir Benkahla, LCIS-ESISAR/INPG, France
- Lionel C. Briand, Fraunhofer IESE, Germany
- Ram Chillarege, IBM Watson Research Center, USA
- Joanne Bechta Dugan, Univ. of Virginia, USA
- Saida Benlarbi, CISTEL, Canada
- Bojan Cukic, West Virginia University, USA
- William W. Everett, SPRE, Inc., USA
- Eduardo Fernandez, Florida Atlantic University, USA
- Nishith Goel, CISTEL, Canada
- J. Robert Horgan, Bellcore, USA
- Kalai Kalaichelvan, Nortel-Advanced Technology, Canada
- Wendell D. Jones, Nortel, USA
- Karama Kanoun, LAAS-CNRS, France
- Rick Karcich, Storage Technology Corporation, USA
- Lora Kassab, Naval Research Lab, USA
- Sam Keene, Independent Consultant, USA
- Taghi M. Khoshgoftaar, Florida Atlantic Univ., USA
- Kane Kim, UC Irvine, USA
- George Knafl, DePaul Univ., USA
- Bruno Lague, Bell Canada, Canada
- Jean-Claude Laprie, LAAS-CNRS, France
- Michael R. Lyu, The Chinese University of Hong Kong, Hong Kong
- Yashwant K. Malaiya, Colorado State Univ., USA
- Jose Carlos Maldonado, ICMSC-USP, Brazil
- Aditya P. Mathur, Purdue Univ., USA
- Anneliese von Mayrhauser, Colorado State Univ., USA
- Walcelio Melo, ORACLE and UCB, Brazil
- John Munson, Univ. Idaho, USA
- John D. Musa, Independent Consultant, USA
- Allen Nikora, JPL, USA
- Mitsuru Ohba, Hiroshima City Univ., Japan
- Alberto Pasquini, ENEA, Italy
- Hoang Pham, Rutgers University, USA
- Anthony T. Rivers, Viatec Research, USA
- H. Dieter Rombach, Univ. Kaiserslautern, Germany
- Linda H. Rosenberg, Unisys Corporation, USA
- Peter Santhanam, IBM T. J. Watson Research Center
- Norman Schneidewind, Naval Postgraduate School, USA
- Marty Shooman, Polytechnic Univ., USA
- Carol Smidts, Univ. of Maryland, USA
- George Stark, IBM, USA
- Robert M. Szabo, IBM, USA
- K.S. Trivedi, Duke University, USA
- Jeffrey M. Voas, Reliable Software Tech., USA
- Mladen A. Vouk, North Carolina State Univ., USA
- James Whittaker, Florida Tech Uni., USA
- Elaine Weyuker, AT&T Research, USA
- Claes Wohlin, Lund Univ., Sweden
- Eric Wong, Bellcore, USA